TY  - JOUR 
AU  - Escuela de Ingenierias Industrial, Informática y Aeroespacial
AU  - Cuesta González, Eduardo
AU  - Meana Díaz, Víctor Manuel
AU  - Álvarez Álvarez, Braulio José
AU  - Giganto Fernández, Sara
AU  - Martínez Pellitero, Susana
AU  - Ingenieria de los Procesos de Fabricacion
DA  - 2022/11/11
UR  - https://hdl.handle.net/10612/20534
AB  - [EN] The use of non-contact scanning equipment in metrology and in dimensional and geometric inspection applications is increasing due to its ease of use, the speed and density of scans, and the current costs. In fact, these technologies are becoming...
LA  - eng
PB  - MDPI
KW  - Ingeniería industrial
KW  - 3D optical scanner
KW  - Benchmarking
KW  - Metrological evaluation
KW  - GD&T-based artefac
KW  - Reverse engineering
TI  - Metrology Benchmarking of 3D Scanning Sensors Using a Ceramic GD&T-Based Artefact
DO  - 10.3390/S22228596
T2  - Sensors
VL  - 22
M2  - 8596
ER  -